Lamps for Thin film measurement

Heraeus optical analytical lamps are used in the most varied industries to measure the thickness of even the thinnest coating.

Lamps for Thin film measurement

The two most commonly used thick film measurement methods are reflectometry and ellipsometry. Both are optical, contactless methods in which the light reflected by the sample is used to measure layer thickness.

Thin film measurement is applied to assure the quality of certain production steps in the optical industry, but also in display and semiconductor production.

The following can be measured:

  • Even surfaces / curved surfaces
  • Single and multiple layers of liquid and/or solid substances
  • Materials such as metal, plastic, glass, etc.

For the different applications, Heraeus supplies reliable analytical lamps with different spectral ranges.

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