Condura®+
Condura®+
Choose your PROPERTY PLUS

- Ceramic thickness:Different thicknesses available, depending on the ceramic type
- Customized warpage
Master card with tuned warpage in direction and amplitude - Copper thickness
Different thicknesses available, depending on the ceramic type - Surface finish
- Cu, Ni, NiAu, Ag, Brushing
- Laser scribing for singulation
Innovative laser process which eliminates material residues - Customized dimples
For stress relief in Condura®.classic and Condura®.extra - Grinding
A mechanical surface treatment to ensure optimal bonding
Condura®+
Choose your OPTION PLUS

- Burr-free holes (Laser cut-out)
Innovative laser cutting process for burr-free holes - Data Matrix Code
Continuous traceability - Automated Optical Inspection (AOI)
Implement high level QA procedure - Ultrasonic testing
Non destructive control of the interface between copper and ceramic - Customized packing
Customer specific packing
Condura®+
Choose your PROCESSING PLUS

- Pre-applied solder
- No more solder paste printing & flux cleaning
- Take responsibility through pre-applied material system
- Reduce yield losses
- Process simplification
- No solder stop (dimples or solder mask)
Read more: Condura®+ alumina substrate with pre-applied solder
- Pre-applied sinter paste
- No more sinter paste printing & drying
- Take responsibility through pre-applied material system
- Reduce yield losses
- Process simplification
- Reduces costs
Condura®+
Choose your SERVICE PLUS

- Matching materials
Select matched joining material - Design
Layout of conductive layers, die and components placement - Thermal simulation
Simulation of temperature distribution e.g. for hot spot prediction - Prototyping:
- Module prototyping and metal ceramic substrates assembly
- Functional prototypes for metal ceramic substrates validation
- Active power cycling
Testing of power modules or assembled metal ceramic substrates - Testing
Tests on bare or assembled metal ceramic substrates - Analytics:
- Failure analysis
- Analysis of functional surfaces